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 M36P0R8070E0
256 Mbit (x16, multiple bank, multilevel, burst) Flash memory 128 Mbit (burst) PSRAM, 1.8 V supply, multichip package
Features
Multichip package - 1 die of 256 Mbit (16 Mb x 16, multiple bank, multilevel, burst) Flash memory - 1 die of 128 Mbit (8 Mb x16) PSRAM Supply voltage - VDDF = VCCP = VDDQ = 1.7 to 1.95 V - VPPF = 9 V for fast program (12 V tolerant) Electronic signature - Manufacturer code: 20h - Device code: 8818 Package - ECOPACK(R) Synchronous/asynchronous read - Synchronous burst read mode: 108 MHz, 66 MHz - Asynchronous page read mode - Random access: 93 ns Programming time - 4 s typical Word program time using Buffer Enhanced Factory Program command Memory organization - Multiple bank memory array: 32 Mbit banks - Four EFA (extended flash array) blocks of 64 Kbits Dual operations - Program/erase in one bank while read in others - No delay between read and write operations Security - 64bit unique device number - 2112 bit user programmable OTP Cells 100 000 program/erase cycles per block
FBGA
TFBGA107 (ZAC)
Flash memory
Block locking - All blocks locked at power-up - Any combination of blocks can be locked with zero latency - WPF for block lock-down - Absolute write protection with VPPF = VSS CFI (common Flash interface) Access time: 70 ns Asynchronous page read - Page size: 4, 8 or 16 words - Subsequent read within page: 20 ns Synchronous burst read/write Low power consumption - Active current: < 25 mA - Standby current: 200 A - Deep power-down current: 10 A Low power features - PASR (partial array self refresh) - DPD (deep power-down) mode
PSRAM



December 2007
Rev 2
1/22
www.numonyx.com 1
Contents
M36P0R8070E0
Contents
1 2 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Signal descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.1 2.2 2.3 2.4 2.5 2.6 2.7 2.8 2.9 2.10 2.11 2.12 2.13 2.14 2.15 2.16 2.17 2.18 2.19 2.20 2.21 2.22 Address inputs (A0-A23) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Data input/output (DQ0-DQ15) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Latch Enable (L) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Clock (K) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Wait (WAIT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Flash Chip Enable input (EF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Flash Output Enable inputs (GF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Flash Write Enable (WF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Flash Write Protect (WPF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Flash Reset (RPF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Flash Deep Power-Down (DPDF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 PSRAM Chip Enable input (EP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 PSRAM Write Enable (WP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 PSRAM Output Enable (GP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 PSRAM Upper Byte Enable (UBP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 PSRAM Lower Byte Enable (LBP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 PSRAM Configuration Register Enable (CRP) . . . . . . . . . . . . . . . . . . . . . 11 VDDF supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 VCCP supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 VDDQ supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 VPPF program supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3 4 5
Functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2/22
M36P0R8070E0
Contents
6 7 8
Package mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3/22
List of tables
M36P0R8070E0
List of tables
Table 1. Table 2. Table 3. Table 4. Table 5. Table 7. Table 8. Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Main operating modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Operating and AC measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
4/22
M36P0R8070E0
List of figures
List of figures
Figure 1. Figure 2. Figure 3. Figure 4. Figure 5. Figure 6. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 TFBGA connections (top view through package) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Functional block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 AC measurement I/O waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 AC measurement load circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 TFBGA107 8 x 11 mm 9 x 12 active ball array, 0.8 mm pitch, package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
5/22
Description
M36P0R8070E0
1
Description
The M36P0R8070E0 combines two memories in a multichip package:

256-Mbit multiple bank Flash memory (the M58PR256J) 128-Mbit PSRAM (the M69KB128AA).
This datasheet should be read in conjunction with the M58PR256J and M69KB128AA datasheets, which are available from your local Numonyx distributor. Recommended operating conditions do not allow more than one memory to be active at the same time. The memory is offered in a stacked TFBGA107 package, and it is supplied with all the bits erased (set to `1'). Figure 1. Logic diagram
VDDF VDDQ 24 A0-A23 EF GF WF RPF WPF L K DPDF EP GP WP CRP UBP LBP VSS M36P0R8070E0 VCCP
VPPF 16 DQ0-DQ15 WAIT
AI12097
6/22
M36P0R8070E0 Table 1.
Name A0-A23(1) DQ0-DQ15 VDDQ VPPF VDDF VCCP VSS L K WAIT NC DU Flash memory EF GF WF RPF WPF DPDF PSRAM EP GP WP CRP UBP LBP Chip Enable input Output Enable input Write Enable input Configuration Register Enable input Upper Byte Enable input Lower Byte Enable input Chip Enable input Output Enable input Write Enable input Reset input Write Protect input Deep power-down Address inputs Common data input/output Common Flash and PSRAM power supply for I/O buffers Flash memory optional supply voltage for fast program and erase Flash memory power supply PSRAM power supply Ground Latch Enable input Burst Clock Wait output Not connected internally Do not use as internally connected
Description Signal names
Function
1. A23 is an address input for the Flash memory component only.
7/22
Description Figure 2. TFBGA connections (top view through package)
1 2 3 4 5 6 7 8
M36P0R8070E0
9
A
DU
NC
NC
NC
VCCP
DPDF
VSS
DU
B
DU
A4
A18
A19
VSS
VDDF
NC
A21
A11
C
NC
A5
LBP
A23
VSS
NC
K
A22
A12
D
VSS
A3
A17
NC
VPPF
WP
EP
A9
A13
E
VSS
A2
A7
NC
WPF
L
A20
A10
A15
F
NC
A1
A6
UBP
RPF
WF
A8
A14
A16
G
VDDQ
A0
DQ8
DQ2
DQ10
DQ5
DQ13
WAIT
NC
H
VSS
GP
DQ0
DQ1
DQ3
DQ12
DQ14
DQ7
NC
J
DU
NC
GF
DQ9
DQ11
DQ4
DQ6
DQ15
VDDQ
K
NC
EF
NC
NC
NC
VCCP
NC
VDDQ
CRP
L
DU
VSS
VSS
VDDQ
VDDF
VSS
VSS
VSS
VSS
M
DU
NC
DU
DU
DU
DU
DU
DU
DU
AI112006
8/22
M36P0R8070E0
Signal descriptions
2
Signal descriptions
See Figure 1: Logic diagram and Table 1: Signal names for a brief overview of the signals connected to this device.
2.1
Address inputs (A0-A23)
Addresses A0-A22 are common inputs for the Flash memory and PSRAM components. Address A23 is an input for the Flash memory component only. The address inputs select the cells in the Flash memory array to access during bus read operations. During bus write operations they control the commands sent to the command interface of the Flash memory's Program/Erase Controller. In the PSRAM the address inputs select the cells in the memory array to access during bus read and write operations.
2.2
Data input/output (DQ0-DQ15)
The data I/O output the data stored at the selected address during a bus read operation or input a command or the data to be programmed during a bus write operation. For the PSRAM component, the Upper Byte Data Inputs/Outputs (DQ8-DQ15) carry the data to or from the upper part of the selected address when Upper Byte Enable (UBP) is driven Low. The Lower Byte Data Inputs/Outputs (DQ0-DQ7) carry the data to or from the lower part of the selected address when Lower Byte Enable (LBP) is driven Low. When both UBP and LBP are disabled, the data inputs/ outputs are high impedance.
2.3
Latch Enable (L)
The Latch Enable pin is common to the Flash memory and PSRAM components. For more details about the Latch Enable signal, please refer to the datasheets of the respective memory components: M69KB128AA for the PSRAM and M58PR256J for the Flash memory.
2.4
Clock (K)
The Clock input pin is common to the Flash memory and PSRAM components. For more details about the Clock signal, please refer to the datasheets of the respective memory components: M69KB128AA for the PSRAM and M58PR256J for the Flash memory.
9/22
Signal descriptions
M36P0R8070E0
2.5
Wait (WAIT)
WAIT is an output pin common to the Flash memory and PSRAM components. However, the WAIT signal does not behave in the same way for the PSRAM and the Flash memory. For details on this signal, please refer to the M69KB128AA datasheet for the PSRAM and to the M58PR256J datasheet for the Flash memory.
2.6
Flash Chip Enable input (EF)
The Chip Enable input activates the control logic, input buffers, decoders, and sense amplifiers of the Flash memory. When Chip Enable is Low, VIL, and Reset is High, VIH, the device is in active mode. When Chip Enable is at VIH the Flash memory are deselected, the outputs are high impedance and the power consumption is reduced to the standby level. It is not allowed to have EF at VIL and EP at VIL at the same time. Only one memory component can be enabled at a time.
2.7
Flash Output Enable inputs (GF)
The Output Enable input controls the data outputs during Flash memory bus read operations.
2.8
Flash Write Enable (WF)
The Write Enable input controls the bus write operation of the Flash memory command interface. The data and address inputs are latched on the rising edge of Chip Enable or Write Enable, whichever occurs first.
2.9
Flash Write Protect (WPF)
Write Protect is an input that provides additional hardware protection for each block. When Write Protect is Low, VIL, lock-down is enabled and the protection status of the locked-down blocks cannot be changed. When Write Protect is at High, VIH, lock-down is disabled and the locked-down blocks can be locked or unlocked. (See the lock status table in the M58PR256J datasheet).
2.10
Flash Reset (RPF)
The Reset input provides a hardware reset of the Flash memories. When Reset is at VIL, the memory is in reset mode: the outputs are high impedance and the current consumption is reduced to the Reset supply current IDD2. After Reset, all blocks are in the locked state and the Configuration Register is reset. When Reset is at VIH, the device is in normal operation. Upon exiting reset mode the device enters asynchronous read mode, but a negative transition of Chip Enable or Latch Enable is required to ensure valid data outputs. The Reset pin can be interfaced with 3 V logic without any additional circuitry, and can be tied to VRPH .
10/22
M36P0R8070E0
Signal descriptions
2.11
Flash Deep Power-Down (DPDF)
The deep power-down input put sthe device in deep power-down mode. When the device is in standby mode and the Enhanced Configuration Register bit ECR15 is set, asserting the deep power-down input causes the memory to enter deep power-down mode. When the device is in the deep power-down mode, the memory cannot be modified and the data is protected. The polarity of the DPDF pin is determined by ECR14. The deep power-down input is active Low by default.
2.12
PSRAM Chip Enable input (EP)
The Chip Enable input activates the PSRAM when driven Low (asserted). When deasserted (VIH), the device is disabled, and goes automatically in low-power standby mode or deep power-down mode, according to the RCR (Refresh Configuration Register) setting.
2.13
PSRAM Write Enable (WP)
Write Enable, WP, controls the bus write operation of the PSRAM. When asserted (VIL), the device is in write mode and write operations can be performed either to the configuration registers or to the memory array.
2.14
PSRAM Output Enable (GP)
When held Low, VIL, the Output Enable, GP, enables the bus read operations of the PSRAM.
2.15
PSRAM Upper Byte Enable (UBP)
The Upper Byte Enable, UBP, gates the data on the Upper Byte Data Inputs/Outputs (DQ8DQ15) to or from the upper part of the selected address during a write or read operation.
2.16
PSRAM Lower Byte Enable (LBP)
The Lower Byte Enable, LBP, gates the data on the Lower Byte Data Inputs/Outputs (DQ0DQ7) to or from the lower part of the selected address during a write or read operation. If both LBP and UBP are disabled (High), the device disables the data bus from receiving or transmitting data. Although the device seems to be deselected, it remains in an active mode as long as EP remains Low.
2.17
PSRAM Configuration Register Enable (CRP)
When this signal is driven High, VIH, bus read or write operations access either the value of the RCR or the BCR (Bus Configuration Register) according to the value of A19.
11/22
Signal descriptions
M36P0R8070E0
2.18
VDDF supply voltage
VDDF provides the power supply to the internal core of the Flash memory. It is the main power supply for all Flash memory operations (read, program and erase).
2.19
VCCP supply voltage
The VCCP supply voltage is the core supply voltage.
2.20
VDDQ supply voltage
VDDQ provides the power supply for the Flash memory and PSRAM I/O pins. This allows all outputs to be powered independently of the Flash memory and PSRAM core power supplies, VDDF and VCCP.
2.21
VPPF program supply voltage
VPPF is both a control input and a power supply pin for the Flash memory. The two functions are selected by the voltage range applied to the pin. If VPPF is kept in a low voltage range (0V to VDDQ) VPPF is seen as a control input. In this case a voltage lower than VPPLK gives absolute protection against program or erase, while VPPF > VPP1 enables these functions. VPPF is only sampled at the beginning of a program or erase; a change in its value after the operation has started does not have any effect and program or erase operations continue. If VPPF is in the range of VPPH it acts as a power supply pin. In this condition VPPF must be stable until the program/erase algorithm is completed.
2.22
VSS ground
VSS is the common ground reference for all voltage measurements in the Flash memory (core and I/O Buffers) and PSRAM chips. It must be connected to the system ground.
Note:
Each Flash memory device in a system should have its supply voltage (VDDF) and the program supply voltage VPPF decoupled with a 0.1 F ceramic capacitor close to the pin (high-frequency, inherently-low inductance capacitors should be as close as possible to the package). See Figure 5: AC measurement load circuit. The PCB track widths should be sufficient to carry the required VPPF program and erase currents.
12/22
M36P0R8070E0
Functional description
3
Functional description
The PSRAM and Flash memory components have separate power supplies but share the same grounds. They are distinguished by two Chip Enable inputs: EF for the Flash memory and EP for the PSRAM. Recommended operating conditions do not allow more than one device to be active at a time. The most common example is a simultaneous read operations on the Flash memory and the PSRAM which results in a data bus contention. Therefore, it is recommended to put the other device in the high impedance state when reading the selected device. Figure 3. Functional block diagram
VDDF A23 EF GF WF RPF WPF 256 Mbit Flash Memory DPDF VPPF
WAIT L K
A0-A22 VCCP VSS VDDQ
DQ0-DQ15
EP GP WP CRP UBP LBP 128 Mbit PSRAM
Ai12098
13/22
Functional description Table 2. Main operating modes(1)
EF GF WF RPF DPDF(2) WAIT
(3)
M36P0R8070E0
Operation
L
EP CRP GP WP LBP UBP
A18A19(4)
A0A17 A20A22
DQ15DQ0 Flash data out
Bus Read Bus Write Address Latch Output Disable Standby Reset
VIL VIL VIH VIH VIL VIH VIL VIH VIL X VIH VIH
deasserted(5) deasserted(5) deasserted(5) deHi-Z asserted(5) deHi-Z asserted(5) deHi-Z asserted(5)
VIL(6) VIL(6) VIL PSRAM must be disabled. Only one Flash memory can be enabled at a time.
Flash data in Flash data out or Hi-Z (7) Hi-Z Hi-Z Hi-Z Hi-Z
Flash memory
VIL VIH VIH VIH VIH X X X X X X VIH VIL
X X X X VIL VIL VIL VIH VIL VIL VIL VIL X VIL VIL VIL Valid Valid
Any PSRAM mode is allowed. Flash memories must be disabled.
Deep PowerVIH X Down Read Write Read Configuration Register Program Configuration Register(9) Standby
VIH asserted(8) Hi-Z
Low-Z VIL Low-Z VIL Flash memories must be disabled
PSRAM data out PSRAM data in X BCR/RC R/DIDR contents
PSRAM
Low-Z VIL
00(RCR) VIL VIH VIL VIH VIL VIL 10(BCR) X1(DIDR) VIL VIH X VIH X VIH VIL VIH X X X X X X X X
Low-Z VIL X X
00(RCR) BCR/ RCR 10(BCR) data
Hi-Z
Any Flash memory mode is Hi-Z allowed. Only one Flash Deep Power- memory can be enabled at a Hi-Z Down(10) time
1. X = Don't Care.
X X
Hi-Z Hi-Z
2. The DPDF signal polarity depends on the value of the ECR14 bit. 3. WAIT signal polarity is configured using the Set Configuration Register command. See the M58PR256J datasheet for details. 4. A18 and A19 are used to select the BCR (Bus Configuration Register), RCR (Refresh Configuration Register) or DIDR (Device ID Register). 5. If ECR15 is set to '0', the Flash memory device cannot enter the Deep Power-Down mode, even if DPDF is asserted. 6. L can be tied to VIH if the valid address has been previously latched. 7. Depends on GF. 8. ECR15 has to be set to `1' for the Flash memory device to enter Deep Power-Down. 9. BCR and RCR only. 10. Bit 4 of the Refresh Configuration Register must be set to `0', bit 4 (BCR4) of the Bus Configuration Register must be set to `0', and E has to be maintained High, VIH, during Deep Power-Down mode.
14/22
M36P0R8070E0
Maximum ratings
4
Maximum ratings
Stressing the device above the rating listed in the absolute maximum ratings table may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Refer also to the Numonyx SURE program and other relevant quality documents. Table 3.
Symbol TA TBIAS TSTG VIO VDDF VCCP VDDQ VPPF IO tVPPH
Absolute Maximum Ratings
Value Parameter Min Ambient operating temperature Temperature under bias Storage temperature Input or output voltage Flash memory supply voltage PSRAM supply voltage Input/output supply voltage Flash memory program voltage Output short circuit current Time for VPPF at VPPH -30 -30 -55 -0.2 -1 -0.2 -0.2 -1 Max 85 85 125 2.45 3 2.45 2.45 12.6 100 100 C C C V V V V V mA hours Unit
15/22
DC and AC parameters
M36P0R8070E0
5
DC and AC parameters
This section summarizes the operating measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and AC characteristics tables in this section are derived from tests performed under the measurement conditions summarized in Table 4., Operating and AC measurement conditions. Designers should check that the operating conditions in their circuit match the operating conditions when relying on the quoted parameters. Table 4. Operating and AC measurement conditions
Flash memory Parameter Min VDDF supply voltage VCCP supply voltage VDDQ supply voltage VPPF supply voltage (factory environment) VPPF supply voltage (application environment) Load capacitance (CL) Output circuit resistors (R1, R2) Input rise and fall times Input pulse voltages Input and output timing ref. voltages
1. Referenced to VSS. 2. VCCP = VDDQ.
PSRAM Unit Min - 1.7 1.7 - - 30 16.7 Max - 1.95 1.95 - - V V V V V pF k ns V V
Max 1.95 - 1.95 9.5 VDDQ +0.4 30 16.7 3
1.7 - 1.7 8.5 -0.4
1(1), (2) 0 to VDDQ VDDQ/2
0 to VDDQ VDDQ/2
Figure 4.
AC measurement I/O waveform
VDDQ VDDQ/2 0V
AI06161
16/22
M36P0R8070E0 Figure 5. AC measurement load circuit
VDDQ
DC and AC parameters
VDDQ VDD 16.7k DEVICE UNDER TEST 0.1F 0.1F CL 16.7k
CL includes JIG capacitance
AI06162
1. VDD means VDDF = VCCP.
Table 5.
Symbol CIN COUT
Capacitance(1)
Parameter Input capacitance Output capacitance Test Condition VIN = 0 V VOUT = 0 V Min - - Max 12 15 Unit pF pF
1. Sampled only, not 100% tested.
17/22
Package mechanical
M36P0R8070E0
6
Package mechanical
To meet environmental requirements, Numonyx offers these devices in ECOPACK(R) packages, which have a lead-free second level interconnect. The category of second level interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. Figure 6. TFBGA107 8 x 11 mm 9 x 12 active ball array, 0.8 mm pitch, package outline
D D1 FD
e
E E1
BALL "B1"
SE
ddd
FE A e b A1 A2
TFBGA-Z2
1. Drawing is not to scale.
18/22
M36P0R8070E0 Table 6.
Package mechanical Stacked TFBGA107 8 x 11 mm 9 x 12 active ball array, 0.8 mm pitch, package data
Millimeters Inches Max 1.20 0.20 0.85 0.35 8.00 6.40 0.10 11.00 8.80 0.80 0.80 1.10 0.40 10.90 11.10 0.433 0.346 0.031 0.031 0.043 0.016 0.429 0.30 7.90 0.40 8.10 0.033 0.014 0.315 0.252 0.004 0.437 0.012 0.311 0.016 0.319 0.008 Typ Min Max 0.047
Symbol Typ A A1 A2 b D D1 ddd E E1 e FD FE SE Min
19/22
Part numbering
M36P0R8070E0
7
Part numbering
Table 7.
Example: Device type M36 = multichip package (Flash + PSRAM) Flash 1 architecture P = Multilevel, multiple bank, large buffer Flash 2 architecture 0 = no die Operating voltage R = VDDF = VCCP = VDDQ = 1.7 to 1.95 V Flash 1 density 8 = 256 Mbits Flash 2 density 0 = no die RAM 1 density 7 = 128 Mbits RAM 0 density 0 = no Die Parameter blocks location E = even block flash memory configuration Product version 0 = 90 nm Flash technology, 93 ns speed; 0.11 m PSRAM technology, 70 ns speed Package ZAC = stacked TFBGA107 C stacked footprint. Option E = ECOPACK package, standard packing F = ECOPACK package, tape and reel packing
Ordering information scheme
M36 P 0 R8 0 7 0 E 0 ZAC E
Note:
Devices are shipped from the factory with the memory content bits erased to '1'. For a list of available options (speed, package, etc.) or for further information on any aspect of this device, please contact the Numonyx sales office nearest to you.
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M36P0R8070E0
Revision history
8
Revision history
Table 8.
Date 2-Oct-2007 10-Dec-2007
Document revision history
Revision 1 2 Initial release. Applied Numonyx branding. Changes
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M36P0R8070E0
Please Read Carefully:
INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH NUMONYXTM PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS PROVIDED IN NUMONYX'S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, NUMONYX ASSUMES NO LIABILITY WHATSOEVER, AND NUMONYX DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING TO SALE AND/OR USE OF NUMONYX PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT. Numonyx products are not intended for use in medical, life saving, life sustaining, critical control or safety systems, or in nuclear facility applications. Numonyx may make changes to specifications and product descriptions at any time, without notice. Numonyx, B.V. may have patents or pending patent applications, trademarks, copyrights, or other intellectual property rights that relate to the presented subject matter. The furnishing of documents and other materials and information does not provide any license, express or implied, by estoppel or otherwise, to any such patents, trademarks, copyrights, or other intellectual property rights. Designers must not rely on the absence or characteristics of any features or instructions marked "reserved" or "undefined." Numonyx reserves these for future definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them. Contact your local Numonyx sales office or your distributor to obtain the latest specifications and before placing your product order. Copies of documents which have an order number and are referenced in this document, or other Numonyx literature may be obtained by visiting Numonyx's website at http://www.numonyx.com. Numonyx StrataFlash is a trademark or registered trademark of Numonyx or its subsidiaries in the United States and other countries. *Other names and brands may be claimed as the property of others. Copyright (c) 11/5/7, Numonyx, B.V., All Rights Reserved.
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